Since the end of 2001, annual IC unit shipments have grown an astounding 120 percent. Will this torrid growth continue? If so, what are the implications for the IC test industry? New Venture Research (NVR), in the 2008 Edition of IC Test Market and Trends, analyzes the semiconductor industry and uses this analysis to forecast the future of the global IC test market.
The report begins with NVR ’s views on the state of the semiconductor industry. This discussion includes a look at global economic factors that may impact the industry. NVR ’s base semiconductor forecast and a mid-year update to that forecast are also provided.
Next, the report presents a brief overview of the technical trends in IC testing. Final test basics and issues are presented. Methods for reducing the cost of final test—including parallel or multi-site testing—are emphasized. The activities of the Semiconductor Test Consortium are reviewed.
Following the technical overview, the report presents final test cost forecasts for each semiconductor product type. This forecast includes units, revenue, and ASP for each product, so that the reader may compare test costs with product revenue. Test cost detail includes estimates for test times (seconds), testing costs (dollars per second), unit test cost (dollars per IC), total product test cost, and test cost as a percentage of product revenue.
Forecasts are also presented for the contract test services market. To help you further assess the companies participating in contract testing, the report profiles the activities of the world’s largest contractors and the services they offer.
The report also profiles a group of key equipment and software companies involved in semiconductor test.
IC Test Markets and Trends, 2008 Edition will provide you with an effective and economical tool for assessing the future of IC testing. The report is delivered by email as a single-user PDF file. The report sells for $1995, with extra single-user licenses at $250 each. Corporate licensing is available—contact us for pricing!
Table of Contents
Chapter 1: Introduction
Chapter 2: Executive Summary
Chapter 3: The State of the Industry
World Economic Outlook
Semiconductor Industry Base Forecast
Chapter 4: Technical Trends
Basics of Final Test
Final Test Issues
Design for Test
Reducing the Cost of Final IC Test
Singulated Testing versus Strip Testing
Parallel or Multi-site Test
Standardized Software Interfaces
Modular ATE Systems
Equipment Cost Trends
Semiconductor Test Consortium
Traditional ATE versus Open-Architecture ATE
Existing Working Groups and Their Functions
Working Groups Forming Now
Future Working Groups
Chapter 5: Market Analysis and Forecast
ROM and EPROM
Standard Cell and PLD
Contract Test Services
Chapter 6: IC Test Contractor Profiles
Das Test Haus
Formosa Adv Tech
Giga Solution Tech
IS Test Lab
True Test Tech
Chapter 7: Equipment and Software Company Profiles